Scherrer Equation:
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The Scherrer equation is used in X-ray diffraction (XRD) analysis to estimate the average crystallite size in a solid material from the broadening of a diffraction peak. It provides a way to determine nanoscale particle sizes in various materials.
The calculator uses the Scherrer equation:
Where:
Explanation: The equation relates the peak broadening in an XRD pattern to the average size of crystallites in the material, assuming the broadening is primarily due to size effects rather than strain or other factors.
Details: Accurate particle size determination is crucial for materials characterization, understanding material properties, optimizing performance in various applications, and quality control in manufacturing processes.
Tips: Enter the Scherrer constant (typically 0.9), X-ray wavelength in nm, FWHM in radians, and Bragg angle in degrees. All values must be positive numbers.
Q1: What Is The Typical Value For The Scherrer Constant K?
A: The Scherrer constant typically ranges from 0.89 to 0.94, with 0.9 being the most commonly used value for spherical crystals with cubic symmetry.
Q2: How Accurate Is The Scherrer Equation?
A: The Scherrer equation provides an estimate of crystallite size. Accuracy depends on proper peak fitting, instrument calibration, and the assumption that size broadening dominates other broadening effects.
Q3: What Are The Limitations Of The Scherrer Equation?
A: The equation assumes uniform crystallite size, spherical shape, and that peak broadening is solely due to size effects. It may underestimate size for non-spherical particles and doesn't account for strain broadening.
Q4: How Do I Convert FWHM From Degrees To Radians?
A: Multiply the FWHM value in degrees by π/180 to convert to radians: β(rad) = β(°) × π/180.
Q5: Can This Equation Be Used For All Materials?
A: The Scherrer equation can be applied to crystalline materials that produce sharp XRD peaks. It works best for nanocrystalline materials with sizes typically below 100 nm.